/*
 * BQ_Abstraction_Layer.h
 *
 *  Created on: 29.01.2022
 *      Author: max
 */

#ifndef INC_BQ_ABSTRACTION_LAYER_H_
#define INC_BQ_ABSTRACTION_LAYER_H_

#include "common_defs.h"
#include "main.h"

#include "stm32f4xx_hal.h"

#define WAKEUP_PIN BQ_Wakeup_Pin
#define WAKEUP_PORT BQ_Wakeup_GPIO_Port

#define CELL_OV_THRESHOLD 55100 // 4.2V
#define CELL_UV_THRESHOLD 34100 // 2.6V

#define BQ_MEASUREMENT_INTERVAL 250 // ms

extern uint16_t cell_voltages[N_CELLS];
extern uint16_t max_voltage, min_voltage;

typedef enum { BQ_OFF, BQ_RDY, BQ_STDBY, BQ_INIT_PHASE, BQ_ERROR } BQ_Status;
extern BQ_Status bq_status;

#define BQ_ERROR_KIND_HAL (1 << 0)
#define BQ_ERROR_KIND_CRC (1 << 1)
#define BQ_ERROR_KIND_FAULT (1 << 2)
#define BQ_ERROR_LOC_MEASURE (1 << 0)
typedef struct {
  uint8_t kind;
  uint8_t hal_loc;
  uint8_t crc_loc;
  uint16_t fault_uv;
  uint16_t fault_ov;
  uint8_t fault_aux_uv;
  uint8_t fault_aux_ov;
  uint16_t fault_cmp_uv;
  uint16_t fault_cmp_ov;
  uint16_t fault_comm;
  uint8_t fault_sys;
  uint16_t fault_dev;
  uint8_t fault_gpi;
} BQ_Error_Description;
extern BQ_Error_Description bq_error;

extern uint32_t lastmeasurementtime;

void afe_init(UART_HandleTypeDef* uarthandle);
void afe_soft_reset();
void afe_shutdown();
void afe_measure();
void afe_selftest();
void afe_wakeup();
void afe_init_fault_thresholds();

void afe_clear_all_faults();
void afe_check_faults();

void afe_update_Checksum();

void afe_config_measurement_channels();
void afe_config_communication();
void afe_config_power();
void afe_config_balancing();
void afe_balance_channels(uint16_t channelstobalance);

void afe_config_gpios();
void afe_activate_LED();

#endif /* INC_BQ_ABSTRACTION_LAYER_H_ */